ADAC – An Automatic System for Measuring Hall Effect in Semiconductors
One of the barriers to detailed materials analysis has been the large effort involved in data acquisition and reduction. This has been greatly reduced in the on hp laboratories by a system called ADAC. New information on the electronic transport properties of InAs has been one of the first benefits of the system.
An important part of any semiconductor material study is to carry out a sufficiently large number of measurements to determine carrier mobility and concentration under varying conditions. Then the data must be reduced and plotted, and the results analyzed to describe the materials.